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 Exhibitor Detail : Kyushu Institute of Technology Nakamura Laboratory
218 

Kyushu Institute of Technology Nakamura Laboratory

Exhibit introduction

We have developed a new circuit simulator which includes the aging degradation effects of device characteristics, such as HCI(Hot Carrier Injection) and NBTI(Negative Bias Temperature Instability). We also demonstrate some examles to discover the weak point in circuit, and to improve the robustness in the performance.


Contact info

Center for Microelectronic Systems, Kyushu Institute of Technology
TEL:0948-29-7584
FAX:0948-29-7586
E-mail:nakamura@cms.kyutech.ac.jp
URL:http://www.cms.kyutech.ac.jp/plan02/index.html

Address

680-4, Kawazu, Iizuka, Fukuoka, JAPAN 8208502
820-8502

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