Exhibitor Detail : Ehime University Higami and Takahashi Laboratory
322 

Ehime University Higami and Takahashi Laboratory

Exhibit introduction

Our general research interests are test generation and fault diagnosis for high-speed, deep-sub micron chips. Based on following competitive research grants, we are investigating techniques to make the test generation and fault diagnosis tools efficient for small delay faults and open faults.

1)Joint Research of Semiconductor Technology Academic Research Center (STARC)
Teat generation tool for open faults
Fault diagnosis tool for open faults

2)Contract Research of STARC
Fault diagnosis tool for small delay faults
Diagnostic test generation tool for transition delay fault

3)Grant-in-Aid Scientific Research(KAKENHI)
Defect-aware test generation tool
Test generation tool for clock delay faults


Contact info

Computer Science Graduate School of Science and Engineering Ehime Univ.
TEL:089-927-9957
FAX:089-927-9973
E-mail:takahasi@cs.ehime-u.ac.jp
URL:http://larissa.cs.ehime-u.ac.jp/~takamatu/site1/index.html

Address

Bunkyo-cho 3, Matsuyama, Ehime, JAPAN
790-8577

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